diffraction ebsd mapping Search Results


electron backscatter diffraction ebsd mapping  (JEOL)
96
JEOL electron backscatter diffraction ebsd mapping
Figure 3. Cross-sectional SEM images of SC-532 samples (A), while the white rectangular box indicates the region where the <t>EBSD</t> mapping was carried out. The band contrast EBSD map (B) and the EBSD orientation map (C) in the selected region of the SC-532 sample. ϕ1, ϕ, and ϕ2 are angles relative to the SEM-axis stage. Each color indicates a specific crystal orientation of the grains.
Electron Backscatter Diffraction Ebsd Mapping, supplied by JEOL, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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oim analysis software  (Gatan Inc)
96
Gatan Inc oim analysis software
Figure 3. Cross-sectional SEM images of SC-532 samples (A), while the white rectangular box indicates the region where the <t>EBSD</t> mapping was carried out. The band contrast EBSD map (B) and the EBSD orientation map (C) in the selected region of the SC-532 sample. ϕ1, ϕ, and ϕ2 are angles relative to the SEM-axis stage. Each color indicates a specific crystal orientation of the grains.
Oim Analysis Software, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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electron backscatter diffraction map  (Meso Scale Diagnostics LLC)
90
Meso Scale Diagnostics LLC electron backscatter diffraction map
Figure 3. Cross-sectional SEM images of SC-532 samples (A), while the white rectangular box indicates the region where the <t>EBSD</t> mapping was carried out. The band contrast EBSD map (B) and the EBSD orientation map (C) in the selected region of the SC-532 sample. ϕ1, ϕ, and ϕ2 are angles relative to the SEM-axis stage. Each color indicates a specific crystal orientation of the grains.
Electron Backscatter Diffraction Map, supplied by Meso Scale Diagnostics LLC, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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k2 summit direct electron detector  (Gatan Inc)
96
Gatan Inc k2 summit direct electron detector
Figure 3. Cross-sectional SEM images of SC-532 samples (A), while the white rectangular box indicates the region where the <t>EBSD</t> mapping was carried out. The band contrast EBSD map (B) and the EBSD orientation map (C) in the selected region of the SC-532 sample. ϕ1, ϕ, and ϕ2 are angles relative to the SEM-axis stage. Each color indicates a specific crystal orientation of the grains.
K2 Summit Direct Electron Detector, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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diffraction ebsd mapping  (JEOL)
98
JEOL diffraction ebsd mapping
Figure 3. Cross-sectional SEM images of SC-532 samples (A), while the white rectangular box indicates the region where the <t>EBSD</t> mapping was carried out. The band contrast EBSD map (B) and the EBSD orientation map (C) in the selected region of the SC-532 sample. ϕ1, ϕ, and ϕ2 are angles relative to the SEM-axis stage. Each color indicates a specific crystal orientation of the grains.
Diffraction Ebsd Mapping, supplied by JEOL, used in various techniques. Bioz Stars score: 98/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/diffraction ebsd mapping/product/JEOL
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electron backscattered diffraction ebsd maps  (Oxford Instruments)
99
Oxford Instruments electron backscattered diffraction ebsd maps
Figure 3. Cross-sectional SEM images of SC-532 samples (A), while the white rectangular box indicates the region where the <t>EBSD</t> mapping was carried out. The band contrast EBSD map (B) and the EBSD orientation map (C) in the selected region of the SC-532 sample. ϕ1, ϕ, and ϕ2 are angles relative to the SEM-axis stage. Each color indicates a specific crystal orientation of the grains.
Electron Backscattered Diffraction Ebsd Maps, supplied by Oxford Instruments, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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feg sem  (Carl Zeiss)
90
Carl Zeiss feg sem
Figure 3. Cross-sectional SEM images of SC-532 samples (A), while the white rectangular box indicates the region where the <t>EBSD</t> mapping was carried out. The band contrast EBSD map (B) and the EBSD orientation map (C) in the selected region of the SC-532 sample. ϕ1, ϕ, and ϕ2 are angles relative to the SEM-axis stage. Each color indicates a specific crystal orientation of the grains.
Feg Sem, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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ebsd electron backscatter diffraction maps  (Gatan Inc)
96
Gatan Inc ebsd electron backscatter diffraction maps
Figure 12. Grain size measured from <t>EBSD</t> maps for grains separated by boundaries with misorientation >1◦: (a) 0Cu QT; (b) 0Cu QRT; (c) 1.5Cu QT; (d) 1.5Cu QRT. Map step was 0.05 µm.
Ebsd Electron Backscatter Diffraction Maps, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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electron backscatter diffraction (ebsd) grain contrast map  (ASM International)
90
ASM International electron backscatter diffraction (ebsd) grain contrast map
Figure 12. Grain size measured from <t>EBSD</t> maps for grains separated by boundaries with misorientation >1◦: (a) 0Cu QT; (b) 0Cu QRT; (c) 1.5Cu QT; (d) 1.5Cu QRT. Map step was 0.05 µm.
Electron Backscatter Diffraction (Ebsd) Grain Contrast Map, supplied by ASM International, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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electron microscopy electron backscattered diffraction pattern sem ebsd method  (Hitachi Ltd)
99
Hitachi Ltd electron microscopy electron backscattered diffraction pattern sem ebsd method
Figure 12. Grain size measured from <t>EBSD</t> maps for grains separated by boundaries with misorientation >1◦: (a) 0Cu QT; (b) 0Cu QRT; (c) 1.5Cu QT; (d) 1.5Cu QRT. Map step was 0.05 µm.
Electron Microscopy Electron Backscattered Diffraction Pattern Sem Ebsd Method, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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evo® ma 15 sem  (Carl Zeiss)
90
Carl Zeiss evo® ma 15 sem
Figure 12. Grain size measured from <t>EBSD</t> maps for grains separated by boundaries with misorientation >1◦: (a) 0Cu QT; (b) 0Cu QRT; (c) 1.5Cu QT; (d) 1.5Cu QRT. Map step was 0.05 µm.
Evo® Ma 15 Sem, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Image Search Results


Figure 3. Cross-sectional SEM images of SC-532 samples (A), while the white rectangular box indicates the region where the EBSD mapping was carried out. The band contrast EBSD map (B) and the EBSD orientation map (C) in the selected region of the SC-532 sample. ϕ1, ϕ, and ϕ2 are angles relative to the SEM-axis stage. Each color indicates a specific crystal orientation of the grains.

Journal: Journal of The Electrochemical Society

Article Title: Comparison of Single Crystal and Polycrystalline LiNi0.5Mn0.3Co0.2O2Positive Electrode Materials for High Voltage Li-Ion Cells

doi: 10.1149/2.0991707jes

Figure Lengend Snippet: Figure 3. Cross-sectional SEM images of SC-532 samples (A), while the white rectangular box indicates the region where the EBSD mapping was carried out. The band contrast EBSD map (B) and the EBSD orientation map (C) in the selected region of the SC-532 sample. ϕ1, ϕ, and ϕ2 are angles relative to the SEM-axis stage. Each color indicates a specific crystal orientation of the grains.

Article Snippet: Electron backscatter diffraction (EBSD) mapping was carried out using a JEOL JSM-7000F SEM at CCEM.

Techniques:

Figure 12. Grain size measured from EBSD maps for grains separated by boundaries with misorientation >1◦: (a) 0Cu QT; (b) 0Cu QRT; (c) 1.5Cu QT; (d) 1.5Cu QRT. Map step was 0.05 µm.

Journal: Metals

Article Title: Influence of Martensite Deformation on Cu Precipitation Strengthening

doi: 10.3390/met10020282

Figure Lengend Snippet: Figure 12. Grain size measured from EBSD maps for grains separated by boundaries with misorientation >1◦: (a) 0Cu QT; (b) 0Cu QRT; (c) 1.5Cu QT; (d) 1.5Cu QRT. Map step was 0.05 µm.

Article Snippet: EBSD (Electron backscatter diffraction) maps were acquired by EDAX Hikari camera (EDAX, Mahwah, NJ, USA).

Techniques: